Technical References for Displays–ILD

(DI-10-01) Permanent Epoxy Used for Gate Dielectric & ILD Layers in Organic TFT Back-Planes
A. Cooper, G Cernigliaro, T. Adams, S. McGloin, T. Pease, S. K. Chatterjee & Dave Barwick
Plastic Electronics 2010

(DI-10-02) AMOLED Displays using Transfer-Printed Integrated Circuits
Ronald S. Cok*, John W. Hamer*
Christopher A. Bower, Etienne Menard, and Salvatore Bonafede
Semprius Inc., 4915 Prospectus Dr., Suite C, Durham, NC, 27713, U.S.A.
60.3 902 • SID,2010

(DI-07-01) All-additive ink-jet-printed display backplanes: Materials development and integration
Ana C. Arias, Jürgen Daniel, Brent Krusor, Steve Ready, Veronica Sholin, and Robert Street
Palo Alto Research Center, Electronic Materials and Devices Laboratory, 3333 Coyote Hill Rd., Palo Research Center, Palo Alto, CA 94070
Journal of the Society for Information Display – July 2007 – Volume 15, Issue 7, pp. 485-490

(DI-05-01)Printing Methods and Materials for Large-Area Electronic Devices
Chabinyc, M.L. Wong, W.S. Arias, A.C. Ready, S. Lujan, R.A. Daniel, J.H. Krusor, B. Apte, R.B. Salleo, A. Street, R.A.
Palo Alto Res. Center Inc., CA, USA
Proceedings of the IEEE, 93, issue 8, p. 1491-1499, Aug. 2005

(DI-05-03) Printed polymer and a-Si TFT backplanes for flexible displays
R. A. Streeta; W. S. Wonga; S. E. Readya; M. L. Chabinyca; A. C. Ariasa; J. H. Daniela; R. B. Aptea; A. Salleoa; R. Lujana; Beng Ongb; Yiliang Wub
a Palo Alto Research Center, Palo Alto, CA
b Xerox Research Center of Canada, Mississauga, Ontario, Canada
Journal of Information Display, Volume 6, Issue 3, 2005, Pages 12 – 17

(DI-00-01) Large-area MEMS fabrication with thick SU-8 photoresist applied to an x-ray image sensor array
Jurgen H. Daniel, Brent S. Krusor, Raj B. Apte, and Robert A. Street
Xerox Palo Alto Research Ctr. (USA)
Adela Goredema, Jason McCallum, Daniele C. Boils-Boissier, and Peter M. Kazmaier
Xerox Research Ctr. Canada (Canada
Micromachining and Microfabrication Process Technology VI Conference
Monday 18 September 2000, Conference Location: Santa Clara, CA, USA
Proc. SPIE 4174, 40 (2000); doi:10.1117/12.396431